Diamond Microscopy probes

Atomic force microscopy probes--components used to image and manipulate materials at the nanoscale--are prone to wear and are considered disposable. A new type, the NaDiaProbe, has reached the marketplace after development by Advanced Diamond Technologies, University of Pennsylvania, and University of Wisconsin-Madison.

The key innovation is a type of diamond--ultrananocrystalline--that takes advantage of the mineral's properties by achieving extremely small grain sizes for extra hardness. It is made using standard semiconductor techniques, which helps keep the cost low. A low inherent friction and adhesion value also reduces wear.