Taking a closer look
When one of the stress tests results in a failure, the analysis lab takes a closer look at the device.
Here is a picture of a cell phone that has been sliced down the middle to get a closer look. The damaged area is isolated and examined under a microscope. Sometimes an electron microscope is used to see very tiny parts of the device. And 3D scans can also be used to isolate problems.
October 7, 2009 1:29 AM PDT
Photo by: Marguerite Reardon/CNET
| Caption by: Marguerite Reardon
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